Denver Microbeam Laboratory

Electron Microscopy and Microanalysis

Filter Total Items: 4
Date published: December 6, 2018

FEI Quanta 450 Field Emission Scanning Electron Microscope

The FEI SEM was installed in 2009. It is capable of high, low, and environmental vacuum modes.  The DML has a cold stage to allow for imaging of wet samples. 

Date published: August 3, 2018

JEOL 8530F Plus SuperProbe

The newest instrument in the Denver Microbeam Laboratories arsenal, is still in the process of installation and acceptance.  

Date published: August 1, 2018

JEOL 8900 Electron Microprobe

By counting the X-rays generated by each element in the sample and comparing that number to the number of X-ray generated by a standard of known composition, it is possible to determine the chemical composition of a spot one one-thousandth of a millimeter in diameter with great accuracy.

Date published: August 1, 2018

JEOL 5800 LV SEM

Affectionately known as “The Old SEM” the JEOL 5800 has been with the USGS in Denver for almost 30 years.