This worksheet displays the results of mineral abundance estimates based on Rietveld refinement of X-ray diffraction (XRD) analyses of mill tailings and other ore processing materials from worldwide localities. Data are also provided to show variation in mineral abundance estimates for subsplits in individual samples. Samples were analyzed using a PANalytical X'Pert Pro diffractometer using Cu radiation and the results interpreted using Highscore Plus v.4.7.
|Title||Estimates of mineral abundances based on Rietveld refinement of X-ray diffraction data from mill tailings and other ore processing materials|
|Authors||Carlin J Green, Robert R Seal, Nadine Piatak|
|Product Type||Data Release|
|Record Source||USGS Digital Object Identifier Catalog|
|USGS Organization||Geology, Energy & Minerals Science Center|