Sulphur has been identified as one of the elements present in the contamination spot which forms under the electron beam in the microprobe. The presence of the sulphur results in a rapid change in intensity measurements causing a loss of observed intensity for elements other than sulphur. The source of sulphur has been traced at least in part to the Apiezon B diffusion pump oil. A comparative X-ray fluorescence study of the Apiezon B and Octoil diffusion pump oils showed substantial amounts of sulphur in the Apiezon B. The Octoil was relatively free of sulphur.
Citation Information
Publication Year | 1962 |
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Title | The detection of sulphur in contamination spots in electron probe X-ray microanalysis |
DOI | 10.1088/0508-3443/13/5/314 |
Authors | I. Adler, E.J. Dwornik, H. J. Rose |
Publication Type | Article |
Publication Subtype | Journal Article |
Series Title | British Journal of Applied Physics |
Index ID | 70010741 |
Record Source | USGS Publications Warehouse |