Sulphur has been identified as one of the elements present in the contamination spot which forms under the electron beam in the microprobe. The presence of the sulphur results in a rapid change in intensity measurements causing a loss of observed intensity for elements other than sulphur. The source of sulphur has been traced at least in part to the Apiezon B diffusion pump oil. A comparative X-ray fluorescence study of the Apiezon B and Octoil diffusion pump oils showed substantial amounts of sulphur in the Apiezon B. The Octoil was relatively free of sulphur.
|Title||The detection of sulphur in contamination spots in electron probe X-ray microanalysis|
|Authors||I. Adler, E.J. Dwornik, H. J. Rose|
|Publication Subtype||Journal Article|
|Series Title||British Journal of Applied Physics|
|Record Source||USGS Publications Warehouse|