The detection of sulphur in contamination spots in electron probe X-ray microanalysis
Sulphur has been identified as one of the elements present in the contamination spot which forms under the electron beam in the microprobe. The presence of the sulphur results in a rapid change in intensity measurements causing a loss of observed intensity for elements other than sulphur. The source of sulphur has been traced at least in part to the Apiezon B diffusion pump oil. A comparative X-ray fluorescence study of the Apiezon B and Octoil diffusion pump oils showed substantial amounts of sulphur in the Apiezon B. The Octoil was relatively free of sulphur.
Citation Information
Publication Year | 1962 |
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Title | The detection of sulphur in contamination spots in electron probe X-ray microanalysis |
DOI | 10.1088/0508-3443/13/5/314 |
Authors | I. Adler, E.J. Dwornik, H. J. Rose |
Publication Type | Article |
Publication Subtype | Journal Article |
Series Title | British Journal of Applied Physics |
Index ID | 70010741 |
Record Source | USGS Publications Warehouse |