Effect of crystal thickness and geometry on the alpha-particle resolution of CsI (Tl)
January 1, 1960
The resolution of CsI(Tl) for Po210 alpha particles has been measured as a function of crystal thickness. The best resolution of a ½‐in. diam cylindrical crystal was obtained for a thickness of 0.38 mm, and the effect of thickness on the resolution is discussed. Based on the proposed model, a conical crystal was designed, which yielded a line width of 1.8% for Po210 alpha particles with a selected photomultiplier tube.
Citation Information
| Publication Year | 1960 |
|---|---|
| Title | Effect of crystal thickness and geometry on the alpha-particle resolution of CsI (Tl) |
| DOI | 10.1063/1.1717121 |
| Authors | P. Martinez, F. E. Senftle |
| Publication Type | Article |
| Publication Subtype | Journal Article |
| Series Title | Review of Scientific Instruments |
| Index ID | 70010512 |
| Record Source | USGS Publications Warehouse |