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Quantitative analysis of major elements in silicate minerals and glasses by micro-PIXE

January 1, 1997

The Guelph micro-PIXE facility has been modified to accommodate a second Si(Li) X-ray detector which records the spectrum due to light major elements (11 ??? Z ??? 20) with no deleterious effects from scattered 3 MeV protons. Spectra have been recorded from 30 well-characterized materials, including a broad range of silicate minerals and both natural and synthetic glasses. Sodium is mobile in some of the glasses, but not in the studied mineral lattices. The mean value of the instrumental constant H for each of the elements Mg, Al, and Si in these materials is systematically 6-8% lower than the H-value measured for the pure metals. Normalization factors are derived which permit the matrix corrections requisite for trace-element measurements in silicates to be based upon pure metal standards for Mg, Al and Si, supplemented by well-established, silicate mineral standards for the elements Na, K and Ca. Rigorous comparisons of electron microprobe and micro-PIXE analyses for the entire, 30-sample suite demonstrate the ability of micro-PIXE to produce accurate analysis for the light major elements in silicates. ?? 1997 Elsevier Science B.V.

Publication Year 1997
Title Quantitative analysis of major elements in silicate minerals and glasses by micro-PIXE
DOI 10.1016/S0168-583X(97)00258-9
Authors J.L. Campbell, G.K. Czamanske, L. MacDonald, W.J. Teesdale
Publication Type Article
Publication Subtype Journal Article
Series Title Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Index ID 70019863
Record Source USGS Publications Warehouse