A rapid-scanning microphotometer is described with which a 10-inch spectrum may be scanned in two minutes. The resulting chart may be 60, 300, or 1,500 cm long (wavelength scale) and 4 cm high (intensity scale). Commercially available components are used.
Citation Information
| Publication Year | 1956 |
|---|---|
| Title | Rapid-scanning microphotometry |
| DOI | 10.3133/tei579 |
| Authors | A.W. Helz |
| Publication Type | Report |
| Publication Subtype | USGS Numbered Series |
| Series Title | Trace Elements Investigations |
| Series Number | 579 |
| Index ID | tei579 |
| Record Source | USGS Publications Warehouse |