Transitioning laser ablation ICP-MS from research applications to routine trace element microanalysis: A look at quantitative trace element analyses and imaging

January 1, 2009

[No abstract available]

Publication Year	2009
Title	Transitioning laser ablation ICP-MS from research applications to routine trace element microanalysis: A look at quantitative trace element analyses and imaging
DOI	10.1017/S1431927609095282
Authors	A.E. Koenig
Publication Type	Article
Publication Subtype	Journal Article
Series Title	Microscopy and Microanalysis
Index ID	70036635
Record Source	USGS Publications Warehouse

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