This data release comprises major and trace element geochemical data from ninety (90) selected bedrock samples in support of the identification, discrimination, and correlation of map units in the Deep River and Essex quadrangles, Middlesex County, Connecticut. In data tables, the attributes “map_unit_symbol” and "map_unit_name" correlate the sample to the map unit in a planned bedrock geologic Scientific Investigations Map of the Deep River and Essex quadrangles. Data are from three sources, as described below, and are contained in three separate files by data source. 1) X-ray fluorescence (XRF) analyses at Wesleyan University XRF Lab (31 of 90 samples). Major element oxides were measured in fused glass beads, and trace elements were analyzed in pressed pellets. 2) Inductively coupled plasma optical emission spectroscopy (ICP-OES) and inductively coupled plasma mass spectrometry (ICP-MS) analyses at Activation Laboratories, Inc. (11 of 90 samples). See Data Dictionary for method(s) used for each analyte. 3) XRF analyses at U.S. Geological Survey (48 of 90 samples). A table of compiled geochemical results from the Deep River and Essex quadrangles, including an additional fifty-seven (57) legacy analyses, is included with the aforementioned map. Any use of trade, firm, or product names is for descriptive purposes only and does not imply endorsement by the U.S. Government.
