No abstract available.
Citation Information
Publication Year | 2005 |
---|---|
Title | Analysis of background residential dust for World Trade Center signature components using scanning electron microscopy and x-ray microanalysis |
DOI | 10.3133/ofr20051073 |
Authors | Heather Lowers, Gregory P. Meeker, Isabelle K. Brownfield |
Publication Type | Report |
Publication Subtype | USGS Numbered Series |
Series Title | Open-File Report |
Series Number | 2005-1073 |
Index ID | ofr20051073 |
Record Source | USGS Publications Warehouse |