Electron Microscopy and Microanalysis
Electron Microscopy and Microanalysis capabilities.
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FEI Quanta 450 Field Emission Scanning Electron Microscope FEI Quanta 450 Field Emission Scanning Electron Microscope
The FEI SEM was installed in 2009. It is capable of high, low, and environmental vacuum modes. The DML has a cold stage to allow for imaging of wet samples.
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JEOL 8530F Plus SuperProbe JEOL 8530F Plus SuperProbe
The newest instrument in the Denver Microbeam Laboratories arsenal, is still in the process of installation and acceptance.
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JEOL 8900 Electron Microprobe JEOL 8900 Electron Microprobe
By counting the X-rays generated by each element in the sample and comparing that number to the number of X-ray generated by a standard of known composition, it is possible to determine the chemical composition of a spot one one-thousandth of a millimeter in diameter with great accuracy.
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JEOL 5800 LV SEM JEOL 5800 LV SEM
Affectionately known as “The Old SEM” the JEOL 5800 has been with the USGS in Denver for almost 30 years.