Electron Microscopy and Microanalysis
Electron Microscopy and Microanalysis capabilities.
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FEI Quanta 450 Field Emission Scanning Electron Microscope
The FEI SEM was installed in 2009. It is capable of high, low, and environmental vacuum modes. The DML has a cold stage to allow for imaging of wet samples.
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JEOL 8530F Plus SuperProbe
The newest instrument in the Denver Microbeam Laboratories arsenal, is still in the process of installation and acceptance.
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JEOL 8900 Electron Microprobe
By counting the X-rays generated by each element in the sample and comparing that number to the number of X-ray generated by a standard of known composition, it is possible to determine the chemical composition of a spot one one-thousandth of a millimeter in diameter with great accuracy.
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JEOL 5800 LV SEM
Affectionately known as “The Old SEM” the JEOL 5800 has been with the USGS in Denver for almost 30 years.
