FEI Quanta 450 Field Emission Scanning Electron Microscope
The FEI SEM was installed in 2009. It is capable of high, low, and environmental vacuum modes. The DML has a cold stage to allow for imaging of wet samples.
The SEM is equipped with secondary and electron backscattered detectors, a scanning transmission electron detector, an Oxford Instruments 30mm2 silicon drift detector and electron backscatter differaction (EBSD) camera, and an Horiba HCLUE system capable of panchromatic and hyperspectral cathodoluminescence imaging.
The configuration of the SEM allows for qualitative mineral chemistry, determination of mineral orientation, element and phase mapping, automated particle analysis, and CL imaging.
The use of firm, trade, and brand names is for identification purposes only and does not constitute endorsement by the U.S. government.