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An integrated-intensity method for emission spectrographic computer analysis

December 28, 2008

An integrated-intensity method has been devised to improve the computer analysis of data by emission spectrography. The area of the intensity profile of a spectral line is approximated by a rectangle whose height is related to the intensity difference between the peak and background of the line and whose width is measured at a fixed transmittance below the apex of the line. The method is illustrated by the determination of strontium in the presence of greater than 10 percent calcium. The Sr 3380.711-A line, which is unaffected by calcium and which has a linear analytical curve extending from 100-3,000 ppm, has been used to determine strontium in 18 standard reference rocks covering a wide range of geologic materials. Both the accuracy and the precision of the determinations were well within the accepted range for a semiquantitative procedure.

Citation Information

Publication Year 1975
Title An integrated-intensity method for emission spectrographic computer analysis
Authors Catharine P. Thomas
Publication Type Article
Publication Subtype Journal Article
Series Title Journal of Research of the U.S. Geological Survey
Index ID 70164421
Record Source USGS Publications Warehouse