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Obsidian hydration profile measurements using a nuclear reaction technique

January 1, 1974

AMBIENT water diffuses into the exposed surfaces of obsidian, forming a hydration layer which increases in thickness with time to a maximum depth of 20–40 µm (ref. 1), this layer being the basic foundation of obsidian dating2,3.

Publication Year 1974
Title Obsidian hydration profile measurements using a nuclear reaction technique
DOI 10.1038/250044a0
Authors R.R. Lee, D.A. Leich, T.A. Tombrello, J.E. Ericson, I. Friedman
Publication Type Article
Publication Subtype Journal Article
Series Title Nature
Index ID 70001287
Record Source USGS Publications Warehouse
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